---
Type: desktop-application
ID: gwyddion.desktop
Package: gwyddion
Name:
C: Gwyddion
Summary:
cs: Vizualizace a analýza SPM dat
C: SPM data visualization and analysis
ru: Визуализация и анализ данных СЗМ
Description:
pl: >-
<p>Gwyddion jest modularnym programem do wizualizacji i analizy danych mikroskopii z sondą skanującą (SPM). Przeznaczony
jest głównie do analizy danych zawierających wartość pola jako wskaźnik trzeciej współrzędnej położenia - wysokości, otrzymanych
przy pomocy następujących technik: * Mikroskop Sił Atomowych (AFM), * Mikroskop Sił Magnetycznych (MFM), * Skaningowy
Mikroskop Tunelowy (STM), * Mikroskop Optyczny Bliskiego Pola (SNOM lub NSOM) i wiele innych. Może być również użyty
do arbitralnej analizy obrazów danych zawierających wartość pola jako wskaźnik trzeciej współrzędnej położenia - wysokości.</p>
<p>Pakiet zawiera główną aplikację i jej moduły. Zawiera również program Thumbnailer do GNOME (i Xfce), który tworzy podgląd
wszystkich typów plików obsługiwanych przez program Gwyddion.</p>
de: >-
<p>Gwyddion ist ein modular aufgebautes Programm zur Visualisierung und Analyse von Daten der Rastersondenmikroskopie
(Scanning Probe Microscopy - SPM). Es ist vor allem zur Analyse von Höhenfelddaten gedacht, welche durch Mikroskopietechniken
wie * Rasterkraftmikroskopie (Atomic Force Microscopy - AFM), * Magnetkraftmikroskopie (Magnetic Force Microscopy -
MFM), * Rastertunnelmikroskopie (Scanning Tunneling Microscopy - STM), * Optische Rasternahfeldmikroskopie (Near-field
Scanning Optical Microscopy - SNOM oder NSOM) oder andere erhalten wurden. Es kann jedoch zur Analyse beliebiger Höhenfeld-
und Bilddaten genutzt werden.</p>
<p>Dieses Paket beinhaltet das Hauptprogramm und seine Module. Es umfasst außerdem ein Programm für GNOME (und Xfce),
welches Vorschauansichten für alle Gwyddion bekannten Dateitypen erstellt.</p>
sk: >-
<p>Gwyddion je modulárny program na vizualizáciu a analýzu dát mikroskopie skenujúcej sondou (SPM - Scanning Probe Microscopy).
Je primárne určený na analýzu výškových dát získaných mikroskopickými technikami ako sú * atómová silová mikroskopia
(AFM - Atomic Force Microscopy) * magnetická silová mikroskopia (MFM - Magnetic Force Microscopy) * mikroskopia skenujúca
tunelovaním (STM - Scanning Tunneling Microscopy) * optická mikroskopia skenovania blízkym poľom (SNOM alebo NSOM -
Near-field Scanning Optical Microscopy)</p>
<p>a ďalšie. Možno ju však použiť na analýzu ľubovoľne hlboké pole a analýzu obrazu.</p>
C: >-
<p>Gwyddion is a modular program for Scanning Probe Microscopy (SPM) data visualization and analysis. It is primarily
intended for analysis of height field data obtained by microscopy techniques like * Atomic Force Microscopy (AFM), *
Magnetic Force Microscopy (MFM), * Scanning Tunneling Microscopy (STM), * Near-field Scanning Optical Microscopy (SNOM
or NSOM) and others. However, it can be used for arbitrary height field and image analysis.</p>
<p>This package contains the main application and its modules. It also contains a GNOME (and Xfce) thumbnailer which creates
previews for all file types known to Gwyddion.</p>
en: >-
<p>Gwyddion is a modular program for Scanning Probe Microscopy (SPM) data visualization and analysis. It is primarily
intended for analysis of height field data obtained by microscopy techniques like * Atomic Force Microscopy (AFM), *
Magnetic Force Microscopy (MFM), * Scanning Tunneling Microscopy (STM), * Near-field Scanning Optical Microscopy (SNOM
or NSOM) and others. However, it can be used for arbitrary height field and image analysis.</p>
<p>This package contains the main application and its modules. It also contains a GNOME (and Xfce) thumbnailer which creates
previews for all file types known to Gwyddion.</p>
fr: >-
<p>Gwyddion est un programme modulaire pour la visualisation et l’analyse des données de microscopie à sonde locale (SPM
– Scanning Probe Microscopy). Il est principalement conçu pour l’analyse des données du champ de hauteur obtenues par
des techniques telles que (entre autres) : – le microscope à force atomique (AFM – Atomic Force Microscopy) ; – le microscope
à force magnétique (MFM – Magnetic Force Microscopy) ; – le microscope à effet tunnel (STM – Scanning Tunneling Microscopy) ;
– le microscope optique en champ proche (SNOM ou NSOM – Near-field Scanning Optical Microscopy). Il peut aussi être
utilisé pour n’importe quelle analyse de champ de hauteur et d’image.</p>
<p>Ce paquet fournit l'application principale et ses modules. Il contient également un générateur d'aperçu pour
GNOME (et Xfce) permettant de créer des aperçus pour tous les types de fichier pris en charge par Gwyddion.</p>
it: >-
<p>Gwyddion è un programma modulare per la visualizzazione e l'analisi di dati ottenuti con microscopia a sonda a
scansione (SPM, Scanning Probe Microscopy). È principalmente pensato per l'analisi di dati nel campo dell'altezza
ottenuti con tecniche di microscopia quali: * microscopia a forza atomica (AFM); * microscopia a forza magnetica (MFM);
* microscopia a scansione per effetto tunnel (STM); * microscopia ottica a scansione in campo prossimo (SNOM o NSOM)
e altri. Tuttavia può essere usato per analisi di immagini e campi altezza arbitrari.</p>
<p>Questo pacchetto contiene l'applicazione principale ed i suoi moduli. Contiene anche un creatore di miniature
per GNOME, e Xfce, che crea anteprime per tutti i tipi di file gestiti da Gwyddion.</p>
da: >-
<p>Gwyddion er et modulopbygget program for skanning (Skanning Probe Mikroskopi, SPM), samt visualisering og analyse af
data. Det er primært beregnet til analyse af højdefeltdata indhentet via mikroskopiteknikker som * Atomar Force Mikroskopi
(AFM), * Magnetisk Force Mikroskopi (MFM), * Skanning Tunneling Mikroskopi (STM), * Nær-felt Skanning Optisk Mikroskopi
(SNOM eller NSOM) og andet. Det kan dog bruges til vilkårlige højdefelter og til billedanalyse.</p>
<p>Denne pakke indeholder det primære program og dets moduler. Den indeholder også en GNOME (og Xfce) miniaturefremstiller
som opretter forhåndsvisninger af alle kendte filtyper til Gwyddion.</p>
Categories:
- Science
- Physics
- Engineering
- DataVisualization
Keywords:
C:
- SPM
- analysis
- visualization
- microscopy
Icon:
cached:
- name: gwyddion_gwyddion.png
width: 64
height: 64
Launchable:
desktop-id:
- gwyddion.desktop
Provides:
mediatypes:
- application/x-accurexii-txt
- application/x-afm-workshop-spectra
- application/x-aist-nt-spm
- application/x-alicona-imaging-al3d
- application/x-ambios-amb
- application/x-ambios-profile-xml
- application/x-analysis-studio-axd
- application/x-analysis-studio-axz
- application/x-anfatec-spm
- application/x-ape-dax-spm
- application/x-ape-spm
- application/x-attocube-asc
- application/x-bcr-spm
- application/x-bcrf-spm
- application/x-burleigh-bii-spm
- application/x-burleigh-spm
- application/x-burleigh-export-spm
- application/x-code-v-int
- application/x-createc-spm
- application/x-benyuan-csm-spm
- application/x-dektak-opdx
- application/x-dektak-xml
- application/x-dm3-tem
- application/x-dm4-tem
- application/x-dme-spm
- application/x-gwyddion-dump-spm
- application/x-ecs-spm
- application/x-evovis-xml
- application/x-nanosurf-spm
- application/x-femtoscan-spm
- application/x-femtoscan-txt
- application/x-gdef-spm
- application/x-gsf-spm
- application/x-gwyddion-spm
- application/x-gxyzf-spm
- application/x-hitachi-spm
- application/x-hitachi-sem
- application/x-igor-binary-wave
- application/x-intelliwave-esd
- application/x-intematix-spm
- application/x-iso28600-spm
- application/x-jeol-spm
- application/x-jpk-image-scan
- application/x-jeol-jspm
- application/x-keyence-vk4
- application/x-leica-spm
- application/x-olympus-lext-4000
- application/x-mapvue
- application/x-zygo-spm
- application/x-microprof-txt
- application/x-microprof
- application/x-mif-spm
- application/x-mi-spm
- application/x-mul-spm
- application/x-nanoeducator-spm
- application/x-nanomagnetics-spm
- application/x-nanonics-spm
- application/x-nanonis-spm
- application/x-nanonis-spectra
- application/x-nanoobserver-spm
- application/x-nanoscan-spm
- application/x-nanoscantech-spm
- application/x-nanoscope-iii-spm
- application/x-nanoscope-ii-spm
- application/x-nanotop-spm
- application/x-nano-measuring-machine-spm
- application/x-nearly-raw-raster-data
- application/x-nt-mdt-spm
- application/x-olympus-oir
- application/x-olympus-poir
- application/x-oldmda-spm
- application/x-olympus-lext-3000
- application/x-ome-tiff
- application/x-omicron-spm
- application/x-omicron-flat
- application/x-omicron-matrix-spm
- application/x-wyko-opd
- application/x-wyko-asc
- application/x-iso5436-2-spm
- application/x-nanosurf-plt-spm
- application/x-pni-spm
- application/x-symphotime-pt3
- application/x-quesant-afm
- application/x-renishaw-spm
- application/x-rhk-sm3-spm
- application/x-rhk-sm4-spm
- application/x-rhk-sm2-spm
- application/x-robotics-spm
- application/x-s94-stm
- application/x-sdf-spm
- application/x-micromap-spm
- application/x-seiko-spm
- application/x-sensofar-spm
- application/x-sensofarx-spm
- application/x-sensolytics-spm
- application/x-shimadzu-spm
- application/x-shimadzu-spm-asc
- application/x-sicm-spm
- application/x-sis-spm
- application/x-spc-spm
- application/x-spip-asc
- application/x-spmlab-spm
- application/x-spmlab-float-spm
- application/x-spml-spm
- application/x-stmprg-spm
- application/x-stp-spm
- application/x-surf-spm
- application/x-tescan-sem-header
- application/x-tiaser-tem
- application/x-unisoku-spm
- application/x-winstm-spm
- application/x-wipfile-spm
- application/x-witec-ascii-export
- application/x-witec-spm
- application/x-wsf-spm
- application/x-wsxm-spm
- application/x-zeiss-lsm-spm
